OMRON Z-15HQ datasheet PDF

Unit: CPU Units.
Name: Standard LCD type.
No. of I/O points: 10.
LCD display: Yes.
Power supply voltage: 100 to 240 VAC.
Inputs: 6, 100 to 240 VAC.
Outputs: 4, Relays.
Buttons, calendar, and clock: Yes.
Analog input: No.
Even Broader Applications with Increased.
Functionality and Higher Precision Z-15HQ PDF.
Increased functionality in a compact body (70 mm wide × 90 mm high).
Easy programming is available using the LCD and operation,
buttons Z-15HQ (See note 1.).
This single Unit easily provides relay, timer, counter, and time,
switch functions.
Expansion is easy with Expansion I/O Units, allowing up to 44,
I/O points. (See note 2.).
Economy-type and Communications-type CPU Units have been,
added to series Z-15HQ PDF.
Improved Weekly Timers (See note 1.).
Increased timing accuracy with a monthly deviation of ±15 s,
max. Multiple-day operation and pulse output operation have,
been added.
Select from two power supply options:
100 to 240 VAC or 12 to 24 VDC. Contact gap: F (1.0 mm).
Actuator: Slim spring plunger.
Best-selling Basic Switch Boasting.
High Precision and Wide Variety.
A large switching capacity of 15 A with high repeat accuracy Z-15HQ PDF.
A wide range of variations in contact form for your selection: basic,
split-contact, maintained-contact, and adjustable contact gap types.
A series of standard models for micro loads is available.
A series of molded terminal-type models incorporating safety,
terminal protective cover is available. Optical system: positive and negative radiation.
Detection distance: 20 positive and negative 1mm.
Beam shape: linear beam.
Beam diameter: 1.0mm * 20 m.
Resolution: 0.25 M.
Cabble length: 2m Z-15HQ datasheet. The plane of the battery cover.
Measurement of surface precision of steel plate.
HDD base curve determination.
Measurement of the size of small articles. Optical system: Diffuse reflective.
Beam shape: Line beam.
SSensing distance: 100±35mm Z-15HQ datasheet.
Resolution: 5µm.
Stable, Easy & Affordable.
New Regular-reflective Sensor Head.
Designed for Optimal Wafer Measurement.